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Robustness of the neural network based control chart pattern recognition system to non‐normality

Ruey‐Shiang Guh (National Huwei Institute of Technology, Taiwan, R.O.C.)

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Article publication date: 1 February 2002

3329

Abstract

Control chart pattern recognition is a critical issue in statistical process control, as unnatural patterns on control charts are often associated with specific assignable causes adversely affecting the process. Several researchers have recently applied neural networks to pattern recognition for control charts. However, nearly all studies in this area assume that the in‐control process data in the control charts follow a normal distribution. This assumption contradicts the facts of practical manufacturing situations. This paper investigates how non‐normality affects the performance of neural network based control chart pattern recognition models. Extensive performance evaluation was carried out using simulated data with various non‐normalities. The non‐normality was measured in skewness and kurtosis. Numerical results indicate that the neural network based control chart pattern recognition models still perform well in a non‐normal distribution environment in terms of recognition accuracy and speed.

Keywords

Citation

Guh, R. (2002), "Robustness of the neural network based control chart pattern recognition system to non‐normality", International Journal of Quality & Reliability Management, Vol. 19 No. 1, pp. 97-112. https://doi.org/10.1108/02656710210415749

Publisher

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MCB UP Ltd

Copyright © 2002, MCB UP Limited

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