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Reliability Degradation in NMOS Devices Subjected to High Energy Gamma-Ray Irradiation

D.M. Barry ()

M. Meniconi ()

M. Al-Ghazi ()

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Article publication date: 1 November 1993

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Citation

Barry, D.M., Meniconi, M. and Al-Ghazi, M. (1993), "Reliability Degradation in NMOS Devices Subjected to High Energy Gamma-Ray Irradiation", International Journal of Quality & Reliability Management, Vol. 10 No. 7. https://doi.org/10.1108/02656719310043760

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Emerald Group Publishing Limited

Copyright © 1993, Emerald Group Publishing Limited

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