Improvement Detection by Control Charts for High Yield Processes
M. Xie
()
T.N. Goh
()
International Journal of Quality & Reliability Management
ISSN: 0265-671X
Article publication date: 1 November 1993
157
Keywords
Citation
Xie, M. and Goh, T.N. (1993), "Improvement Detection by Control Charts for High Yield Processes", International Journal of Quality & Reliability Management, Vol. 10 No. 7. https://doi.org/10.1108/02656719310043779
Publisher
:Emerald Group Publishing Limited
Copyright © 1993, Emerald Group Publishing Limited