Keywords
Citation
(2003), "Orbotech launches new Infinex-3000", Circuit World, Vol. 29 No. 2. https://doi.org/10.1108/cw.2003.21729bad.001
Publisher
:Emerald Group Publishing Limited
Copyright © 2003, MCB UP Limited
Orbotech launches new Infinex-3000
Orbotech launches new Infinex-3000
Keywords: Orbotech
Orbotech Ltd have announced the introduction of its new InFinex-3000(tm) series of automated optical inspection (AOI) systems in the Pacific Rim. Designed to meet the major challenges of printed circuit board (PCB) and IC packaging production involving complex fine-line and IC packaging substrate designs, InFinex is a state-of- the-art AOI system that delivers next generation inspection performance for intricate Flip Chip BGAs, CSPs and fine-line applications.
InFinex expands and complements Orbotech’s current line of AOI solutions for PCB production that includes the InSpire-9000™, Vision- 300AP™and SK™ series.
In addition, InFinex is Orbotech’s flagship system for advanced in-process inspection in the Company’s line of integrated packaging substrate solutions (from design to AOI to final inspection) that also includes the proven ICP-8000™ series of color automated visual inspection systems for use at the final inspection stage and Genesis 2000™, the industry’s leading CAM system featuring high-density interconnection tools.
The InFinex technical platform accommodates the most advanced technological developments in product design. InFinex systems combine new image acquisition technologies and customized algorithms for the detection of microscopic defects with pin-point accuracy. InFinex’s customized, high-speed optics and electronics enable fast inspection of large volumes of chip carriers or fine-line PCBs at rates of up to 90 sides per hour (for 50 m lines). The system’s advanced techniques ensure precise, consistent inspection of even the most challenging PCB processes including transparent flex, build-up boards, low contrast PCBs and a variety of plated surfaces.
InFinex greatly reduces false call rates and enables the scanning of large numbers of IC substrates economically even at the highest resolutions.
For more information, please visit www.orbotech.com