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Sensitivity of Alpha‐Optimal Sampling Plans

Elart von Collani (Universität Würzburg)
Klaus Meder (Universität Würzburg)

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Article publication date: 1 January 1988

164

Abstract

The most frequently used attribute sampling plan in MIL‐STD 105 D. In cases, however, when the quality level of incoming lots is generally sufficiently good, MIL‐STD 105 D often leads to unnecessarily high sampling cost. This can be avoided by using α‐optimal sampling plans. The authors outline the α‐optimal sampling scheme along with a simple procedure to determine α‐optimal sampling plans at workshop level. These plans depend on three parameters which have to be estimated from recorded data. In this article the effects of estimation errors in these parameters are investigated.

Keywords

Citation

von Collani, E. and Meder, K. (1988), "Sensitivity of Alpha‐Optimal Sampling Plans", International Journal of Quality & Reliability Management, Vol. 5 No. 1, pp. 39-52. https://doi.org/10.1108/eb002895

Publisher

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MCB UP Ltd

Copyright © 1988, MCB UP Limited

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