User-friendly AOI system for pre-reflow inspection

Soldering & Surface Mount Technology

ISSN: 0954-0911

Article publication date: 1 December 2000

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Keywords

Citation

(2000), "User-friendly AOI system for pre-reflow inspection", Soldering & Surface Mount Technology, Vol. 12 No. 3. https://doi.org/10.1108/ssmt.2000.21912cad.017

Publisher

:

Emerald Group Publishing Limited

Copyright © 2000, MCB UP Limited


User-friendly AOI system for pre-reflow inspection

User-friendly AOI system for pre-reflow inspection

Keywords CyberOptics, Inspection, Reflow

CyberOptics have introduced the KS 100 in-line, pre-reflow inspection system featuring proprietary Statistical Appearance ModelingTM technology developed at the University of Manchester, UK. Unlike conventional AOI systems that require complex programming, KS 100 learns inspection parameters and creates a mathematical model of a good PCB simply by seeing a few examples of good boards. All the complexities of statistical image analysis are invisible to the user.

KS 100 is accurate to 10 microns (0.40 mils) and repeatable to 3 microns (0.12 mils), and is capable of measuring the tightest process specifications. False calls are minimal; during production the system continues to collect data and update the model, so over time performance gradually improves until the typical false call rate is less than 20 PPM.

KS 100 inspects everything on the board, including components, connectors, labels, logos and polarity marks. Programming is easy: after downloading CAD placement data, the user draws a box around each inspection site and shows the system several good examples. The system uses the collected data to construct a mathematical model without any further user involvement. Once a model has been created for a specific component, it can be re-used elsewhere.

The system includes a built-in conveyor; an extended conveyor is available. Other options include Applied Stats® SPC software, and a remote workstation for off-line programming and board repair.

Further information: http://www.cyberoptics.com

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