Online from: 1954
Subject Area: Mechanical & Materials Engineering
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|Title:||FIB-SEM investigation of trapped intermetallic particles in anodic oxide films on AA1050 aluminium|
|Author(s):||M. Jariyaboon, (Department of Mechanical Engineering, Technical University of Denmark, Lyngby, Denmark Department of Chemistry, Faculty of Science, Mahidol University, Bangkok, Thailand and Center for Surface Science and Engineering, Faculty of Science, Mahidol University, Salaya, Thailand), P. Møller, (Department of Mechanical Engineering, Technical University of Denmark, Lyngby, Denmark), R.E. Dunin-Borkowski, (Center for Electron Nanoscopy, Technical University of Denmark, Lyngby, Denmark), R. Ambat, (Department of Mechanical Engineering, Technical University of Denmark, Lyngby, Denmark)|
|Citation:||M. Jariyaboon, P. Møller, R.E. Dunin-Borkowski, R. Ambat, (2011) "FIB-SEM investigation of trapped intermetallic particles in anodic oxide films on AA1050 aluminium", Anti-Corrosion Methods and Materials, Vol. 58 Iss: 4, pp.173 - 178|
|Keywords:||AA1050, Anodic protection, Anodizing, FIB-SEM, Intermetallic particle, Organometallic compounds, Oxides|
|Article type:||Research paper|
|DOI:||10.1108/00035591111148885 (Permanent URL)|
|Publisher:||Emerald Group Publishing Limited|
|Acknowledgements:||M. Jariyaboon is supported by The Hans Christian Ørsted Postdoc Fellowship Programme. The authors would like to thank A. Nicole MacDonald (Center for Electron Nanoscopy, Technical University of Denmark) for her assistance in FIB-SEM.|
Purpose – The purpose of this investigation is to understand the structure of trapped intermetallics particles and localized composition changes in the anodized anodic oxide film on AA1050 aluminium substrates.
Design/methodology/approach – The morphology and composition of Fe-containing intermetallic particles incorporated into the anodic oxide films on industrially pure aluminium (AA1050, 99.5 per cent) has been investigated. AA1050 aluminium was anodized in a 100?ml/l sulphuric acid bath with an applied voltage of 14?V at 20°C ±2°C for 10 or 120?min. The anodic film subsequently was analyzed using focused ion beam-scanning electron microscopy (FIB-SEM), SEM, and EDX.
Findings – The intermetallic particles in the substrate material consisted of Fe or both Fe and Si with two different structures: irregular and round shaped. FIB-SEM cross-sectioned images revealed that the irregular-shaped particles were embedded in the anodic oxide film as a thin strip structure and located near the top surface of the film, whereas the round-shaped particles were trapped in the film with a spherical structure, but partially dissolved and were located throughout the thickness of the anodic film. The Fe/Si ratio of the intermetallic particles decreased after anodizing.
Originality/value – This paper shows that dual beam FIB-SEM seems to be an easy, less time consuming and useful method to characterize the cross-sectioned intermetallic particles incorporated in anodic film on aluminium.
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