The conference programme for 2006

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 May 2006

36

Citation

(2006), "The conference programme for 2006", Microelectronics International, Vol. 23 No. 2. https://doi.org/10.1108/mi.2006.21823bab.010

Publisher

:

Emerald Group Publishing Limited

Copyright © 2006, Emerald Group Publishing Limited


The conference programme for 2006

The conference programme for 2006

The conference spectacle at SENSOR+TEST is extended by another highlight in 2006. A new conference on the challenges for sensor and measurement technology in pharma production of the future is organized in co- operation with the Fraunhofer Institute for Physical Measurement Techniques and the Arbeitsgemeinschaft für Pharmazeutische Verfahrenstechnik e.V. and supplements the first-class conference programme of SENSOR+TEST 2006. “The internationally renowned and established conferences OPTO and IRS2 and the première of the conference on `Dependable Basis for Reliable Measurement – New International Fundamentals and Guidelines' are now enhanced by a forum for new developments and market opportunities in the highly interesting application field of pharma production,” as Bödeker aptly comments. The 2006 programme is certainly something to be proud of the following.

OPTO 2006 (30 May-1 June 2006) – Seventh International Conference on Optical Technologies, Optical Sensors and Measuring Techniques

ChairProfessor Dr Elmar Wagner, Fraunhofer Institute for Physical Measurement Techniques, Freiburg.

Session subjects

  • Components and modules.

  • Measurement methods.

  • Applications.

  • Special session on innovative products.

  • Poster session.

IRS2 2006 (30-31 May 2006) – Ninth International Conference on Infrared Sensors and Systems

ChairProfessor Dr-Ing. Gerald Gerlach, Technical University of Dresden, Institute of Solid State Electronics.

Session subjects

  • IR sensors and arrays.

  • IR components and systems.

  • Thermal imaging and pyrometry.

  • Gas analysis.

  • Poster session.

Dependable Basis for Reliable Measurement – New International Fundamentals and Guidelines

This new conference chaired by Professor Manfred Peters from the Physikalisch-Technische Bundesanstalt of Braunschweig celebrates its première at SENSOR+TEST. The conference on 30/31 May 2006 focuses on international developments in the field of statutory measurement. The keynote presentations include the approval procedures for test equipment and the test regulations for measurement software.

Pharma Production 2010 – Challenges for Sensor and Measurement Technology

At this conference chaired by Dr Annette Braun, Fraunhofer Institute for Physical Measurement Techniques of Freiburg, specialists from the measurement industry and pharma industry discuss how new international standards for process analysis in pharma production can be fulfilled with the aid of modern sensor and measurement technology.

The complete conference programme, which also includes additional guest conferences, is available at www.sensor-test.com.

Three top exhibitions in parallel in May 2006

SENSOR+TEST takes place parallel to two other attractive technology exhibitions in Nürnberg in 2006: SMT/HYBRID/PACKAGING and PCIM Europe. The organizers AMA Service GmbH and Mesago Messe Frankfurt GmbH expect a total of around 1,200 exhibitors and 35,000 trade visitors at this unique combination of three individual exhibitions in Nürnberg.

Information on the exhibition and conferences: AMA Service GmbH, Von-Münchhausen-Str. 49, 31515 Wunstorf, Germany or Holger Bödeker. Tel: +49 (0) 50 33. 96 39-0; fax: +49 (0) 50 33. 10 56; e-mail: info@sensorfairs.de; web site: www.sensor-test.com

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